Predicted Useful Lifetime of Aerospace Electronics Experiencing Ionizing Radiation: Application of BAZ Model

Abstract

The objective of the analysis is to demonstrate how the Boltzmann-Arrhenius-Zhurkov (BAZ) model, originally suggested by Zhurkov in the kinetic concept of the strength of solids as a generalization of the Arrhenius theory of chemical reactions, can be effectively employed for the prediction of the lifetime of electronic materials experiencing ionizing radiation. The “loading term” γσ in the original BAZ model, where σ is the tensile mechanical stress and γ is the sensitivity factor, is replaced with the term γRD, where D is the radiation level and γR is the sensitivity factor. Leakage current measured during the failure-oriented-accelerated-testing (FOAT) is considered in our analysis as a suitable indication/criterion of the level of the induced damage. FOAT terminates, when the agreed upon critical value of the leakage current is reached. Citation: Ponomarev A, Suhir E (2019) Predicted Useful Lifetime of Aerospace Electronics Experiencing Ionizing Radiation: Application of BAZ Model. J Aerosp Eng Mech 3(1):167-169 Ponomarev and Suhir. Dermatol Arch 2019, 3(1):167-169 Open Access | Page 168 | Here T is the testing temperature. In such a situation the factor γI does not affect the factor γR. Finally, after the sensitivity factors γI and γR are evaluated, the activation energy can be found as