{"title":"Critical EMC test issues needing early resolution","authors":"C. B. White","doi":"10.1109/ISEMC.2012.6351797","DOIUrl":null,"url":null,"abstract":"EMC test programs are often very lengthy and expensive. It is very important to address a number of critical EMC test issues as early in the program as possible to ensure complete and accurate planning, budgeting and design criteria. This paper presents and discusses a number of typical critical EMC test issues needing early resolution in programs. Suggestions are also provided to help control the potential impact of these issues.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2012.6351797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
EMC test programs are often very lengthy and expensive. It is very important to address a number of critical EMC test issues as early in the program as possible to ensure complete and accurate planning, budgeting and design criteria. This paper presents and discusses a number of typical critical EMC test issues needing early resolution in programs. Suggestions are also provided to help control the potential impact of these issues.
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