{"title":"SET: interactive tool for learning and training scan-based DFT principles and their consequences to parameters of embedded system","authors":"Josef Strnadel, Z. Kotásek","doi":"10.1109/ECBS.2006.65","DOIUrl":null,"url":null,"abstract":"In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system","PeriodicalId":430872,"journal":{"name":"13th Annual IEEE International Symposium and Workshop on Engineering of Computer-Based Systems (ECBS'06)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th Annual IEEE International Symposium and Workshop on Engineering of Computer-Based Systems (ECBS'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECBS.2006.65","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to illustrate relation between design and diagnostic parameters of embedded system
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