TSDTest: A Efficient Coverage Guided Two-Stage Testing for Deep Learning Systems

Hao Li, Shihai Wang, Tengfei Shi, Xinyue Fang, Jian Chen
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Abstract

In recent years, Deep Learning systems have been applied to face recognition, autonomous vehicles and other safety-critical fields. Testing Deep Learning systems effectively and adequately is increasingly significant. In this paper, we proposed and implemented TSDTest, a coverage guided two-stage testing framework for deep learning systems. To test more logic for Deep Neuron Network (DNN), TSDTest generates highly diverse test cases with as high neuron coverage as possible during its two stages. Compared with DLFuzz, TSDTest achieved an average 1.75% improvement in neuron coverage and 80.3% more adversarial test inputs on MNIST and Fashion-MNIST. And the step dynamical adjustment also effectively reduces $l_{2}$ distance and avoids the manual identification of test oracle. The implementation of TSDTest shows its effectiveness and superiority in generating diverse test cases and improving the robustness of DNN.
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TSDTest:深度学习系统的有效覆盖引导两阶段测试
近年来,深度学习系统已被应用于人脸识别、自动驾驶汽车和其他安全关键领域。有效和充分地测试深度学习系统变得越来越重要。在本文中,我们提出并实现了TSDTest,这是一个覆盖指导的深度学习系统两阶段测试框架。为了测试深度神经元网络(DNN)的更多逻辑,TSDTest在其两个阶段中生成高度多样化的测试用例,并尽可能高的神经元覆盖率。与DLFuzz相比,TSDTest在MNIST和Fashion-MNIST上的神经元覆盖率平均提高了1.75%,对抗性测试输入平均增加了80.3%。阶跃动态调整也有效地减少了$l_{2}$的距离,避免了人工识别测试oracle。TSDTest的实现证明了其在生成多样化测试用例和提高深度神经网络鲁棒性方面的有效性和优越性。
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