{"title":"Computer aided design tools for VLSI","authors":"R. Smith, R. Joy","doi":"10.1109/ISSCC.1980.1156095","DOIUrl":null,"url":null,"abstract":"The computer-aided design segment of the IC industry has had some success with tools to help with the LSI design problem. Particularly, circuit and logic simulation, layout graphics, and design rule checking have been very useful. Other areas, such as testing and modeling, continue to present challenges at the LSI level. As VLSI structures become a reality, new magnitudes of CAD tools will be needed. Can existing tools be scaled to solve the problem or will new approaches be required?","PeriodicalId":229101,"journal":{"name":"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1980.1156095","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The computer-aided design segment of the IC industry has had some success with tools to help with the LSI design problem. Particularly, circuit and logic simulation, layout graphics, and design rule checking have been very useful. Other areas, such as testing and modeling, continue to present challenges at the LSI level. As VLSI structures become a reality, new magnitudes of CAD tools will be needed. Can existing tools be scaled to solve the problem or will new approaches be required?
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