Analysis of quantum capacitance on different dielectrics and its dependence on threshold voltage of CNTFET

Singh Rohitkumar Shailendra, V. N. Ramakrishnan
{"title":"Analysis of quantum capacitance on different dielectrics and its dependence on threshold voltage of CNTFET","authors":"Singh Rohitkumar Shailendra, V. N. Ramakrishnan","doi":"10.1109/ICNETS2.2017.8067933","DOIUrl":null,"url":null,"abstract":"In this work the authors have focused on Carbon Nanotube (CNT) and Carbon Nanotubes Field Effect Transistors (CNTFETs). In every 18 months the number of transistors in an integrated circuit doubles according to Moore's law. This increased number of transistors means the size of transistors will decrease as a result of which the circuit size decreases. As the size of the transistor decreases below 10 nm, the traditional MOSFETs show multiple limitations, thereby leading to the development of CNTFETs in order to replace these MOSFETs. For CNTFETs, the quantum capacitance plays a major role in deciding the gate capacitance. The band gap of CNT is inversely proportional to the diameter of carbon nanotube. The saturation current increases when dielectric constant value increases. In this paper, it is studied that the nano-scale domain CNTFETs devices are better compare to MOSFETs due to their reduced quantum capacitance.","PeriodicalId":413865,"journal":{"name":"2017 International Conference on Nextgen Electronic Technologies: Silicon to Software (ICNETS2)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on Nextgen Electronic Technologies: Silicon to Software (ICNETS2)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICNETS2.2017.8067933","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

In this work the authors have focused on Carbon Nanotube (CNT) and Carbon Nanotubes Field Effect Transistors (CNTFETs). In every 18 months the number of transistors in an integrated circuit doubles according to Moore's law. This increased number of transistors means the size of transistors will decrease as a result of which the circuit size decreases. As the size of the transistor decreases below 10 nm, the traditional MOSFETs show multiple limitations, thereby leading to the development of CNTFETs in order to replace these MOSFETs. For CNTFETs, the quantum capacitance plays a major role in deciding the gate capacitance. The band gap of CNT is inversely proportional to the diameter of carbon nanotube. The saturation current increases when dielectric constant value increases. In this paper, it is studied that the nano-scale domain CNTFETs devices are better compare to MOSFETs due to their reduced quantum capacitance.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
不同介质上的量子电容及其对CNTFET阈值电压的依赖性分析
在这项工作中,作者主要关注碳纳米管(CNT)和碳纳米管场效应晶体管(cntfet)。根据摩尔定律,集成电路中晶体管的数量每18个月翻一番。晶体管数量的增加意味着晶体管的尺寸将减小,电路尺寸也随之减小。随着晶体管的尺寸减小到10nm以下,传统的mosfet显示出多重局限性,从而导致cntfet的发展,以取代这些mosfet。对于cntfet来说,量子电容是决定栅极电容的主要因素。碳纳米管的带隙与碳纳米管的直径成反比。饱和电流随着介电常数的增大而增大。本文研究了纳米域cntfet器件由于量子电容的减小而优于mosfet器件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Security protocols for Internet of Things: A survey Secure identity management in mobile cloud computing Vehicle license plate detection and recognition using non-blind image de-blurring algorithm A connectivity protocol for star topology using wireless sensor network Enhancing the efficiency of carry skip adder using MBFA-10T
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1