{"title":"Susceptibility of a Sigma-Delta Converter to EMI","authors":"Domenico Musumeci, F. Fiori","doi":"10.1109/EMCZUR.2009.4783466","DOIUrl":null,"url":null,"abstract":"This paper discusses the susceptibility of Sigma-Delta Analog-to-Digital converters to disturbances, arising from environmental electromagnetic pollution or from the parasitic coupling with noisy building blocks integrated in the same system-on-chip (SoC) or system-in-package (SiP). The operation of a first-order switched-capacitor sigma-delta converter, which receives at its input nominal signals corrupted by radio-frequency interference is analyzed through time domain computer simulations and the root causes of failures are discussed in detail.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2009.4783466","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper discusses the susceptibility of Sigma-Delta Analog-to-Digital converters to disturbances, arising from environmental electromagnetic pollution or from the parasitic coupling with noisy building blocks integrated in the same system-on-chip (SoC) or system-in-package (SiP). The operation of a first-order switched-capacitor sigma-delta converter, which receives at its input nominal signals corrupted by radio-frequency interference is analyzed through time domain computer simulations and the root causes of failures are discussed in detail.
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