Response corrected tuning space mapping for yield estimation and design centering

Abstract

We enhance a tuning space mapping algorithm through a response correction. We demonstrate that the response corrected tuning model can serve as a high-performance surrogate for fast yield estimation and design centering. We illustrate yield analysis of a second-order tapped-line microstrip filter using our model. We perform yield-driven design on a double-ring filter example and verify the design with the EM model.