Total dose behavior of partially depleted SOI dynamic threshold voltage MOS (DTMOS) for very low supply voltage applications (0.6-1 V)

V. Ferlet-Cavrois, P. Paillet, O. Musseau, J. Leray, O. Faynot, C. Raynaud, J. Pelloie
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引用次数: 10

Abstract

The DTMOS architecture is particularly suited to very low supply voltage applications (0.6-1V). This paper presents DTMOS devices processed with a partially depleted 0.25 /spl mu/m SOI technology. It analyses their electrical behavior under total dose irradiation.
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部分耗尽SOI动态阈值电压MOS (DTMOS)在极低电源电压(0.6-1 V)下的总剂量行为
DTMOS架构特别适合非常低的电源电压应用(0.6-1V)。本文介绍了采用部分耗尽0.25 /spl mu/m SOI技术加工的DTMOS器件。分析了它们在总剂量照射下的电学行为。
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