{"title":"Fault detection of key components based on the TEDS images of electric multiple unit (EMU) undercarriages","authors":"Zhenzuo Chen, Duo Hao Pan, Wushen Chen","doi":"10.1117/12.2689096","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":170548,"journal":{"name":"Third International Conference on Optics and Image Processing (ICOIP 2023)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third International Conference on Optics and Image Processing (ICOIP 2023)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2689096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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