{"title":"Simulating diffraction effects in heliospheric imagers","authors":"S. Tappin, J. Davies, C. Eyles","doi":"10.1093/rasti/rzad033","DOIUrl":null,"url":null,"abstract":"\n In this paper we consider the modelling of diffracted stray light in heliospheric imagers. The emphasis is on the imagers proposed by RAL Space as part of the phase A/B1 study for ESA’s Vigil (formerly called Lagrange) L5 monitoring mission. In order to handle the extreme diffraction angles, a one-dimensional version of the PROPER diffraction modelling library has been developed. This is used to compute patterns at the lens aperture, and the standard two-dimensional version is then used to continue propagation to the sensor plane. The effects of key instrument and modelling parameters are analysed with a view to optimizing accuracy of the modelling and the diffraction performance of the instrument.","PeriodicalId":367327,"journal":{"name":"RAS Techniques and Instruments","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"RAS Techniques and Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1093/rasti/rzad033","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper we consider the modelling of diffracted stray light in heliospheric imagers. The emphasis is on the imagers proposed by RAL Space as part of the phase A/B1 study for ESA’s Vigil (formerly called Lagrange) L5 monitoring mission. In order to handle the extreme diffraction angles, a one-dimensional version of the PROPER diffraction modelling library has been developed. This is used to compute patterns at the lens aperture, and the standard two-dimensional version is then used to continue propagation to the sensor plane. The effects of key instrument and modelling parameters are analysed with a view to optimizing accuracy of the modelling and the diffraction performance of the instrument.