H. Schellekens, S. Olive, K. P. Huy, P. Ndiaye, C. Pasqualini
{"title":"Nature of late breakdowns in VI's after short circuit interruption","authors":"H. Schellekens, S. Olive, K. P. Huy, P. Ndiaye, C. Pasqualini","doi":"10.1109/DEIV.2004.1422645","DOIUrl":null,"url":null,"abstract":"Late breakdowns in vacuum interrupters after short circuit current interruption are studied with three methods. 1. High speed photography of the contact surface and the inter-electrode space to correlate the position of the restrike with respect to the prevailing conditions on the contact surface : 2. Spectrography during arcing and restrike to evaluate ionized particle densities and electron density ; and 3. A double imaging system to calculate the trajectories of droplets during the TRV phase. We found 95% of the restrikes to be associated with hydrogen in the inter-electrode gap at current zero, and remaining hot spots on the edge of the contact surface. We conclude the breakdown to be of a mixed Paschen type: partially in metal vapour of high density around hot spots and ignited by thermal electron emission, and partially in hydrogen gas which accumulates during arcing in the interrupter.","PeriodicalId":137370,"journal":{"name":"XXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV.","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"XXIst International Symposium on Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DEIV.2004.1422645","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Late breakdowns in vacuum interrupters after short circuit current interruption are studied with three methods. 1. High speed photography of the contact surface and the inter-electrode space to correlate the position of the restrike with respect to the prevailing conditions on the contact surface : 2. Spectrography during arcing and restrike to evaluate ionized particle densities and electron density ; and 3. A double imaging system to calculate the trajectories of droplets during the TRV phase. We found 95% of the restrikes to be associated with hydrogen in the inter-electrode gap at current zero, and remaining hot spots on the edge of the contact surface. We conclude the breakdown to be of a mixed Paschen type: partially in metal vapour of high density around hot spots and ignited by thermal electron emission, and partially in hydrogen gas which accumulates during arcing in the interrupter.