Nature of late breakdowns in VI's after short circuit interruption

H. Schellekens, S. Olive, K. P. Huy, P. Ndiaye, C. Pasqualini
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引用次数: 2

Abstract

Late breakdowns in vacuum interrupters after short circuit current interruption are studied with three methods. 1. High speed photography of the contact surface and the inter-electrode space to correlate the position of the restrike with respect to the prevailing conditions on the contact surface : 2. Spectrography during arcing and restrike to evaluate ionized particle densities and electron density ; and 3. A double imaging system to calculate the trajectories of droplets during the TRV phase. We found 95% of the restrikes to be associated with hydrogen in the inter-electrode gap at current zero, and remaining hot spots on the edge of the contact surface. We conclude the breakdown to be of a mixed Paschen type: partially in metal vapour of high density around hot spots and ignited by thermal electron emission, and partially in hydrogen gas which accumulates during arcing in the interrupter.
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VI短路中断后后期击穿的性质
用三种方法研究了真空断路器短路断流后的后期击穿。1. 对接触面和电极间空间进行高速摄影,以便将重击的位置与接触面上的普遍条件相关联;电弧和重击过程中的光谱分析,以评估电离粒子密度和电子密度;和3。在TRV阶段计算液滴轨迹的双成像系统。我们发现95%的重击与电流为零时电极间隙中的氢和接触面边缘的热点有关。我们认为击穿是混合帕申型:部分击穿在热点周围高密度的金属蒸气中,由热电子发射点燃,部分击穿在灭弧过程中积聚的氢气中。
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