Plasmon-phonon interaction in α-Ag2Se thin films

Sh. M. Alekperova, A. Aliyev, K. Jalilova, G. S. Gadjiyeva
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Abstract

For the first time on the experimental IR reflection spectra R(λ) of α -Ag2Se films with charge carrier concentration 4,0 x 1018 cm-3 at 300 K behind of plasma minimum (1150 cm-1) are detected two further minimums (800 cm-1 and 550cm-1), stipulated by interaction of plasmon and long-wave optical (LO) phonons. It was founded the peculiarities in the behaviour of the optical function (ε1; ε2; -Im ε-1) at the interaction of the free charge carrier with the polarizable ions of lattice oscillations. The frequency of longitudinal and transversal phonons is calculated.
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α-Ag2Se薄膜中等离子体-声子相互作用
在距离等离子体最小值(1150 cm-1) 300 K时,载流子浓度为4,0 × 1018 cm-3的α -Ag2Se薄膜的实验红外反射光谱R(λ)首次检测到两个最小值(800 cm-1和550cm-1),这是等离子体与长波光学(LO)声子相互作用的结果。建立了光学函数(ε1;ε2;-Im ε-1)在自由载流子与晶格振荡极化离子的相互作用。计算了纵向声子和横向声子的频率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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