Yinglei Ren, T. Su, J. Hsu, Bruce Liu, M. Wei, Wei Shen, Y. L. Li
{"title":"Case learnings of power noise impact on SATA","authors":"Yinglei Ren, T. Su, J. Hsu, Bruce Liu, M. Wei, Wei Shen, Y. L. Li","doi":"10.1109/APEMC.2015.7175371","DOIUrl":null,"url":null,"abstract":"With the increase of data rate, signal integrity (SI) becomes a bigger challenge for printed circuit board (PCB) designs. Power noise as well as signal loss, inter-symbol interference (ISI), crosstalk needs to be taken into account to ensure a good quality signal design. In this paper, a design case is shared where power noise greatly impacts SATA performance and leads to hard disk (HDD) disconnection. Noise source and noise coupling path are root-caused with simulation and measurement data. And learnings from this case is summarized for future attention.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2015.7175371","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
With the increase of data rate, signal integrity (SI) becomes a bigger challenge for printed circuit board (PCB) designs. Power noise as well as signal loss, inter-symbol interference (ISI), crosstalk needs to be taken into account to ensure a good quality signal design. In this paper, a design case is shared where power noise greatly impacts SATA performance and leads to hard disk (HDD) disconnection. Noise source and noise coupling path are root-caused with simulation and measurement data. And learnings from this case is summarized for future attention.