Applying big data technologies to high tech manufacturing

D. Ortloff, Nils Knoblauch
{"title":"Applying big data technologies to high tech manufacturing","authors":"D. Ortloff, Nils Knoblauch","doi":"10.1117/12.2535589","DOIUrl":null,"url":null,"abstract":"The systematic analysis of ever-increasing data collection presents companies with ever-greater challenges. Many manufacturing organizations simply lack the know-how to handle Big Data projects and the corresponding data analysis right. Therefore one simply follows the current trends and buzz words and adopts approaches which are currently en vogue. This approach often leads to less successful projects and several regularly reoccurring patterns of misconceptions can be identified. This paper highlights some of these unsuccessful patterns and introduces some of the work done in the PRO-OPT SMART-DATA research project. The innovation in this data analysis approach is the combination of traditional statistical methods with new Big Data and AI analysis techniques applied to high tech manufacturing. Being able to align process data with the complete metrology data provides amazing new insights into the manufacturing. Furthermore, we will introduce a new visualization technique specifically suited for domains with high amounts of categorical data like semiconductor, photovoltaics, electronics and such. This paper will show how the combination of the statistical data analysis system Cornerstone in conjunction with Apache Spark1 and Apache Cassandra2 provides a good basis for engineering analytics of massive data amounts. By properly nesting the solid mathematical methods in Cornerstone with big data-appropriate infrastructure such as Apache Spark and, in our case, Apache Cassandra, many new analytics issues can be addressed. Analyzes that used to be inefficient due to the sheer volume of data in classically modeled schema’s can now be performed through appropriate big-table modeling and provide the ability to provide completely new insights into production data. Those directly impacted the manufacturing procedures and improved the products quality and reliability. Experiences gained in the project impacted the upcoming VDI/VDE guideline 37143 to be published later in the year 2019.","PeriodicalId":287066,"journal":{"name":"European Mask and Lithography Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"European Mask and Lithography Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2535589","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The systematic analysis of ever-increasing data collection presents companies with ever-greater challenges. Many manufacturing organizations simply lack the know-how to handle Big Data projects and the corresponding data analysis right. Therefore one simply follows the current trends and buzz words and adopts approaches which are currently en vogue. This approach often leads to less successful projects and several regularly reoccurring patterns of misconceptions can be identified. This paper highlights some of these unsuccessful patterns and introduces some of the work done in the PRO-OPT SMART-DATA research project. The innovation in this data analysis approach is the combination of traditional statistical methods with new Big Data and AI analysis techniques applied to high tech manufacturing. Being able to align process data with the complete metrology data provides amazing new insights into the manufacturing. Furthermore, we will introduce a new visualization technique specifically suited for domains with high amounts of categorical data like semiconductor, photovoltaics, electronics and such. This paper will show how the combination of the statistical data analysis system Cornerstone in conjunction with Apache Spark1 and Apache Cassandra2 provides a good basis for engineering analytics of massive data amounts. By properly nesting the solid mathematical methods in Cornerstone with big data-appropriate infrastructure such as Apache Spark and, in our case, Apache Cassandra, many new analytics issues can be addressed. Analyzes that used to be inefficient due to the sheer volume of data in classically modeled schema’s can now be performed through appropriate big-table modeling and provide the ability to provide completely new insights into production data. Those directly impacted the manufacturing procedures and improved the products quality and reliability. Experiences gained in the project impacted the upcoming VDI/VDE guideline 37143 to be published later in the year 2019.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
将大数据技术应用于高技术制造业
对不断增加的数据收集的系统分析给公司带来了更大的挑战。许多制造企业缺乏处理大数据项目和相应数据分析的能力。因此,人们只需遵循当前的趋势和流行语,并采用当前流行的方法。这种方法经常导致不太成功的项目,并且可以识别出一些经常重复出现的误解模式。本文重点介绍了其中一些不成功的模式,并介绍了PRO-OPT SMART-DATA研究项目所做的一些工作。这种数据分析方法的创新之处在于将传统的统计方法与应用于高科技制造业的新大数据和人工智能分析技术相结合。能够将过程数据与完整的计量数据对齐,为制造提供了惊人的新见解。此外,我们将介绍一种新的可视化技术,特别适用于具有大量分类数据的领域,如半导体,光伏,电子等。本文将展示统计数据分析系统Cornerstone与Apache Spark1和Apache Cassandra2的结合如何为海量数据的工程分析提供良好的基础。通过将坚实的数学方法与适合大数据的基础设施(如Apache Spark,在我们的例子中是Apache Cassandra)适当地嵌套在Cornerstone中,可以解决许多新的分析问题。过去由于经典建模模式中的大量数据而导致效率低下的分析,现在可以通过适当的大表建模来执行,并提供对生产数据的全新见解。这些直接影响到生产过程,提高了产品的质量和可靠性。项目中获得的经验影响了即将于2019年晚些时候发布的VDI/VDE指南37143。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Synergy between quantum computing and semiconductor technology New registration calibration strategies for MBMW tools by PROVE measurements OPC flow for non-conventional layouts: specific application to optical diffusers Lithographic performance of resist ma-N 1402 in an e-beam/i-line stepper intra-level mix and match approach High-precision optical constant characterization of materials in the EUV spectral range: from large research facilities to laboratory-based instruments
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1