Measurement and Calculation of the Critical Pulsewidth for Gain Saturation in Semiconductor Optical Amplifiers

P. Borri, J. Mørk, J. M. Hvam, A. Mecozzi
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引用次数: 50

Abstract

Active semiconductor optical waveguides are essential components in many recently proposed devices for high-speed optical signal processing. It is well known that ultrafast carrier dynamics, like carrier heating and spectral holeburning, lead to gain non-linearities, which restrict the modulation bandwidth of semiconductor lasers. In the case of pulse amplification, these non-linearities lead to a pulsewidth dependence of the gain saturation [1]. A critical pulsewidth can be defined [2], which separates two qualitatively different regimes: a long-pulse regime, where the gain is determined by the pulse energy only, and a short-pulse regime, where the gain also depends on the pulsewidth. Calculated critical pulsewidths are on the order of several picoseconds [1], which is getting in the range of pulses being explored for ultrafast optical signal processing. Experiments that we are aware of. however, do not investigate the detailed dependence of the saturation energy versus pulse duration, and subsequently do not allow extraction of the critical pulsewidth.
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半导体光放大器增益饱和临界脉宽的测量与计算
有源半导体光波导是许多高速光信号处理器件中必不可少的元件。众所周知,超快载流子动力学,如载流子加热和光谱烧洞,会导致增益非线性,从而限制半导体激光器的调制带宽。在脉冲放大的情况下,这些非线性导致脉冲宽度依赖于增益饱和[1]。临界脉冲宽度可以定义为[2],它将两种性质不同的状态分开:长脉冲状态,其中增益仅由脉冲能量决定;短脉冲状态,其中增益也取决于脉冲宽度。计算出的临界脉冲宽度约为几皮秒,这已经进入了用于超快光信号处理的脉冲范围。我们知道的实验。然而,不调查饱和能量与脉冲持续时间的详细依赖关系,随后不允许提取临界脉宽。
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