{"title":"A new effective and efficient measure for outlying aspect mining","authors":"Durgesh Samariya, Sunil Aryal, K. Ting","doi":"10.1007/978-3-030-62008-0_32","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":424892,"journal":{"name":"WISE","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-04-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"WISE","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-62008-0_32","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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