A V-band wafer probe using ridge-trough waveguide

Abstract

A V-band wafer probe was successfully designed and built. A novel waveguide, the ridge-trough waveguide, was used in the transition from rectangular waveguide to coplanar waveguide, and a mathematical model was developed to describe its principal characteristics. A 25X model was built to confirm the mathematical model predictions and to model the performance of the waveguide used in the V-band probe. Reinforced by the 25X model results, a working V-band probe was constructed with bias capability. This probe performed well, and measurements could be easily corrected. Devices were measured at 50-75 GHz to demonstrate that two V-band probes could successfully perform two-port measurements.<>