Invasiveness Estimation of Electro-Optic Probe in Electric Field

Abstract

This paper describes a low invasiveness electro-optic (EO) probe in an electric field from a device under test in comparison with an electrical probe by an experiment and an electromagnetic field simulation. We proposed a new method of an invasiveness estimation based on the difference between the results with and without a probe. The characteristics of the difference in the experimental results agreed with those of the simulation results. The invasiveness of the EO probe was smaller than that of the electrical probe using the proposed method. The invasiveness of the simulation results was underestimated in comparison with that of the experimental results. It is necessary to model the peripheral subjects for accurate invasiveness estimation in the electromagnetic field simulation.