{"title":"Test methods and test equipment for thermal imagers","authors":"T. Williams","doi":"10.1109/CCST.1995.524740","DOIUrl":null,"url":null,"abstract":"Some of the test parameters which can be used for assessing the performance of thermal imagers which are used for surveillance purposes, are discussed. Techniques which can be used for measuring these parameters, both in the laboratory and in the field, are described.","PeriodicalId":376576,"journal":{"name":"Proceedings The Institute of Electrical and Electronics Engineers. 29th Annual 1995 International Carnahan Conference on Security Technology","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings The Institute of Electrical and Electronics Engineers. 29th Annual 1995 International Carnahan Conference on Security Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCST.1995.524740","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Some of the test parameters which can be used for assessing the performance of thermal imagers which are used for surveillance purposes, are discussed. Techniques which can be used for measuring these parameters, both in the laboratory and in the field, are described.
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