Surface Roughness Evaluation of Different Polishing Techniques on Dental Porcelains By Atomic Force Microscopy

G. E. Kunt
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引用次数: 1

Abstract

Introduction: This study was conducted to find out different polishing techniques’ effects on different porcelain materials by using atomic force microscopy (AFM). Material and Methods: Samples were made from four different porcelain materials (VMK 95, Ceramco III, Matchmaker, Vitablocs Mark II). Nine groups (n = 5) were randomly formed from the samples of each ceramic and nine different polishing methods were applied on them. AFM was used to evaluate the external topography and roughness of dental porcelains. To analyze the results of the study ANOVA and Tukey test were used statistically ( = 0.05). Results: Within the porcelain groups Ceramco and Matchmaker had higher Ra values, however VMK 95 and Mark II had lower Ra values. However when the different polishing techniques were compared, Gl (.1110) and SlPg (.2295) were found to have the lowest Ra values and no statistical differences were found between these two techniques (p > .05). In addition, no differences were found between glazed samples (Gl) and after polishing with Sof-lex and Prisma Gloss (Sl-Pg). On the other hand polishing with Sl and Pg together (Sl-Pg) significantly decreases the surface area. Conclusions: There were statistically significance between the glazed and the other specimens. Different polishing methods influenced the surface topography of different porcelains significantly ( p < .001).
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原子力显微镜下不同抛光工艺对牙釉质表面粗糙度的评价
摘要:本研究利用原子力显微镜(AFM)研究了不同抛光工艺对不同陶瓷材料的抛光效果。材料和方法:采用VMK 95、Ceramco III、Matchmaker、vitablos Mark II四种不同的陶瓷材料制作样品,每种陶瓷样品随机分成9组(n = 5),并采用9种不同的抛光方法。采用原子力显微镜(AFM)对牙体表面形貌和粗糙度进行了评价。对研究结果进行统计学分析,采用方差分析和Tukey检验(= 0.05)。结果:在陶瓷组中,Ceramco和Matchmaker的Ra值较高,而vmk95和Mark II的Ra值较低。然而,当比较不同抛光工艺时,发现Gl(.1110)和SlPg(.2295)的Ra值最低,两种工艺之间没有统计学差异(p > 0.05)。此外,釉面样品(Gl)与使用soflex和Prisma Gloss (Sl-Pg)抛光后的样品(Gl)之间没有差异。另一方面,Sl和Pg一起抛光(Sl-Pg)显著减少表面积。结论:釉面标本与其他标本间差异有统计学意义。不同抛光方法对不同陶瓷表面形貌有显著影响(p < 0.001)。
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