Testing-what's missing? An incomplete list of challenges

S. Reddy
{"title":"Testing-what's missing? An incomplete list of challenges","authors":"S. Reddy","doi":"10.1109/ICCD.1995.528843","DOIUrl":null,"url":null,"abstract":"Summary form only given. As the testing area becomes mature, the challenges it poses shift. We describe some of these challenges and how they are addressed in recent works in various areas of testing. In recent years, the formulations of testing problems have changed from \"given a problem, find a solution\" to \"given a problem and quality measures, find a high-quality solution\". Quality guarantees in the form of lower and upper bounds and optimal solutions are derived, in addition to the more conventional demonstration of performance on benchmark circuits. Quality guarantees allow one to measure the distance between a given solution and an optimal solution, and provide criteria for evaluating a new procedure that are more effective than comparison to previously proposed procedures. We review several areas where bounds and optimal solutions have been found. Most procedures are specific to a given problem, and cannot be reused to solve other problems. In contrast, general-purpose paradigms allow a large variety of problems to be solved cost-effectively by plugging in the appropriate procedures into the same algorithm. Such paradigms allow faster program development and reuse of expertise acquired in solving other problems under the same paradigm. We describe several attempts at using existing paradigms and developing new ones, that successfully compete with special-purpose procedures. Recent works address testing issues at increasingly higher levels of the design cycle and offer an integrated treatment of design and test. High-level failure models are considered as well as solutions that are completely independent of a failure model. We describe some of these works and the advantages of the two directions. We conclude with an (incomplete) list of challenges for future research.","PeriodicalId":281907,"journal":{"name":"Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors","volume":"52 27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.1995.528843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Summary form only given. As the testing area becomes mature, the challenges it poses shift. We describe some of these challenges and how they are addressed in recent works in various areas of testing. In recent years, the formulations of testing problems have changed from "given a problem, find a solution" to "given a problem and quality measures, find a high-quality solution". Quality guarantees in the form of lower and upper bounds and optimal solutions are derived, in addition to the more conventional demonstration of performance on benchmark circuits. Quality guarantees allow one to measure the distance between a given solution and an optimal solution, and provide criteria for evaluating a new procedure that are more effective than comparison to previously proposed procedures. We review several areas where bounds and optimal solutions have been found. Most procedures are specific to a given problem, and cannot be reused to solve other problems. In contrast, general-purpose paradigms allow a large variety of problems to be solved cost-effectively by plugging in the appropriate procedures into the same algorithm. Such paradigms allow faster program development and reuse of expertise acquired in solving other problems under the same paradigm. We describe several attempts at using existing paradigms and developing new ones, that successfully compete with special-purpose procedures. Recent works address testing issues at increasingly higher levels of the design cycle and offer an integrated treatment of design and test. High-level failure models are considered as well as solutions that are completely independent of a failure model. We describe some of these works and the advantages of the two directions. We conclude with an (incomplete) list of challenges for future research.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
测试的失踪吗?一份不完整的挑战清单
只提供摘要形式。随着测试领域的成熟,它所带来的挑战也发生了变化。我们描述了其中的一些挑战,以及如何在不同测试领域的近期工作中解决这些挑战。近年来,测试问题的表述从“给定问题,找到解决方案”转变为“给定问题和质量措施,找到高质量的解决方案”。除了在基准电路上进行更常规的性能演示外,还推导出了以下界和上界形式的质量保证和最优解。质量保证允许人们测量给定解决方案和最优解决方案之间的距离,并提供评估新程序的标准,该程序比以前提出的程序更有效。我们回顾了几个已经找到边界和最优解的领域。大多数过程都是特定于给定问题的,不能被重用来解决其他问题。相比之下,通用范例允许通过将适当的过程插入到相同的算法中,以经济有效的方式解决大量的问题。这样的范例允许更快的程序开发和重用在解决相同范例下的其他问题时获得的专业知识。我们描述了几种使用现有范例和开发新范例的尝试,这些范例成功地与专用程序竞争。最近的工作在设计周期的越来越高的层次上解决测试问题,并提供设计和测试的综合处理。考虑高级故障模型以及完全独立于故障模型的解决方案。我们介绍了其中的一些工作和两个方向的优势。最后,我们列出了未来研究面临的挑战(不完整)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Design and implementation of a 100 MHz centralized instruction window for a superscalar microprocessor Multiprocessor design verification for the PowerPC 620 microprocessor Connection-oriented net model and fuzzy clustering techniques for K-way circuit partitioning Dynamic minimization of OKFDDs Simple tree-construction heuristics for the fanout problem
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1