A high speed and low power on CMOS/SOI technology

M. Lee, M. Fujishima, K. Asada
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引用次数: 4

Abstract

Summary form only given. The propagation delay times were improved up to two times in deep-submicron CMOS/SIMOX ring oscillators by reducing the poly-Si gate thickness (t/sub m/). The measured power dissipations with 0.1- to 0.25- mu m gate length are under 1.5 fJ, while theoretical minimum power dissipations can be reduced down to 0.1 fJ for 0.15- mu m gate length at a supply voltage of 1.5 V. SOI technology shows promise for high speed and low power by reducing the gate fringing capacitance which is correlated to t/sub m/. >
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一种高速低功耗的CMOS/SOI技术
只提供摘要形式。在深亚微米CMOS/SIMOX环形振荡器中,通过减小多晶硅栅极厚度(t/sub m/),传输延迟时间提高了2倍。在电源电压为1.5 V时,栅极长度为0.1 ~ 0.25 μ m时的测量功耗低于1.5 fJ,而在栅极长度为0.15 μ m时的理论最小功耗可降至0.1 fJ。SOI技术通过降低与t/sub / m/相关的栅极边缘电容,显示出高速和低功耗的前景。>
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