High impedance reflectometer dedicated to non-resonant near-field microwave microscopy

Abstract

In this paper we present a novel method of near-field microwave microscopy using a high impedance measurement system. The proposed system combines a classical vector network analyzer to a high referenced impedance splitter via impedance matching networks. We show that the resulting high impedance reflectometer associated to a tip probe permits to compensate the limitation of the non-resonant mode by using the frequency diversity.