{"title":"A novel low power BIST-TPG with reduced testing time","authors":"V. Thoulath Begam","doi":"10.1201/9780429295300-108","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":253085,"journal":{"name":"Emerging Developments in the Power and Energy Industry","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Emerging Developments in the Power and Energy Industry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9780429295300-108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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