Fractal and structural entropy calculations on the epitaxially grown fulleren structures with the help of image processing

Á. Nemcsics, S. Nagy, Imre Mojze, P. Turmezei
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引用次数: 2

Abstract

Molecular beam epitaxially grown fullerene layers are investigated with the help of image processing. The layered structures are studied in morphological respect. The individual layer morphologies are derived from the atomic force microscopy picture of the surface. The pattern morphology of the certain layers is analysed by box counting method. The surface morphology shows fractal behaviour. The pattern of each layer shows different dimension. The actual dimension depends on the actual distance of the layer from the substrate. The change of the dimension is attributed to the change of the binding behaviour. The topology of the surface is also studied using participation ratio and structural entropy calculations.
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利用图像处理技术计算外延生长富勒烯结构的分形和结构熵
利用图像处理技术研究了分子束外延生长的富勒烯层。从形态学角度研究了层状结构。各个层的形态来源于表面的原子力显微镜图片。用箱形计数法对某些层的图案形态进行了分析。表面形貌呈现分形特征。每一层的图案显示不同的维度。实际尺寸取决于层与基板的实际距离。维度的变化归因于绑定行为的变化。利用参与率和结构熵计算对表面的拓扑结构进行了研究。
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