A novel approach for single view based plane metrology

Abstract

An approach is proposed for single view based plane metrology. The approach is based on a pair of vanishing points from two orthogonal sets of space parallel lines. Extensive experiments on simulated data as well as on real images showed that our new approach can achieve as good result as that of the homography based one which is widely used in the literature, but our new approach does not need any explicit specifications of space control points. Since in many real applications, particularly, in indoor environment, orthogonal lines are not rare, for example, a frame of window or a door, our new approach is of widely applicable.