A comparative study of dielectric properties of As/sub 2/Se/sub 3/ and As/sub 2/Se/sub 3/Bi/sub x/ glassy systems

G. Bordovsky, V.A. Bordovsky, R. Castro
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Abstract

We report about the peculiarities of the dielectric properties of a-As/sub 2/Se/sub 3/ and As/sub 2/Se/sub 3/Bi/sub x/ (x=20 at.%) layers. The As/sub 2/Se/sub 3/ layers are characterized by gradual decrease of /spl epsiv/ with frequency and increase with temperature. A broad maximum is registered on tg/spl delta/-f dependence. At low frequencies f<10/sup -1/ Hz the loss factor increases with temperature. For modified system As/sub 2/Se/sub 3/Bi/sub x/ much greater decrease of /spl epsi/ with frequency and increase with temperature is found. tg/spl delta/-f dependence of this system demonstrates no maximum and at frequencies f<10/sup -1/ Hz the loss factor decreases with temperature. The mentioned above results confirm the assumption that the metal dopants act as positively charge impurities.
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As/sub - 2/Se/sub - 3/和As/sub - 2/Se/sub - 3/Bi/sub - x/玻璃系介电性能的比较研究
我们报道了a-As/sub 2/Se/sub 3/和As/sub 2/Se/sub 3/Bi/sub x/ (x= 20at .%)层介电特性的特殊性。As/sub 2/Se/sub 3/层的epsiv/随频率的增加而逐渐减小,随温度的升高而增大。在tg/spl δ /-f依赖性上注册了一个广泛的最大值。在低频f<10/sup -1/ Hz时,损耗因子随温度升高而增加。对于改进后的As/sub 2/Se/sub 3/Bi/sub x/体系,其/spl epsi/随频率降低,随温度升高。该系统的δ /-f依赖性没有最大值,在频率f<10/sup -1/ Hz时,损耗因子随温度降低。上述结果证实了金属掺杂剂作为正电荷杂质的假设。
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