{"title":"Testability and test architectures","authors":"M. Hare, S. Sicola","doi":"10.1109/REG5.1988.15922","DOIUrl":null,"url":null,"abstract":"The authors define testability and describe the benefits derived from its inclusion in products. Myths about testability are presented. Test architectures that help to maximize the chances of successfully achieving test goals while minimizing hardware and software costs are described.<<ETX>>","PeriodicalId":126733,"journal":{"name":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REG5.1988.15922","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The authors define testability and describe the benefits derived from its inclusion in products. Myths about testability are presented. Test architectures that help to maximize the chances of successfully achieving test goals while minimizing hardware and software costs are described.<>
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