SGEMP Induced Magnetic Field Coupling to Buried Circuits

W. J. Adams, J. G. Burbano, H. B. O Donnell
{"title":"SGEMP Induced Magnetic Field Coupling to Buried Circuits","authors":"W. J. Adams, J. G. Burbano, H. B. O Donnell","doi":"10.1109/ISEMC.1985.7566971","DOIUrl":null,"url":null,"abstract":"This paper analyzes the magnetic field coupling from System Generated Electromagnetic Pulse (SGEMP) in terminal protection devices (TPD's) to non-interface or buried circuits of spacecraft electronics boxes. The analysis approach is outlined and results obtained from a computer based solution of the analysis are presented along with test data collected to empirically verify the analysis. Finally an example is provided in which the analysis results are used to calculate the energy coupled to a buried circuit so that a comparison of known device pulse burn out levels can be made. This technique provides an assessment of device susceptibility to the induced fields for representative circuit board trace layouts.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1985 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1985.7566971","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

This paper analyzes the magnetic field coupling from System Generated Electromagnetic Pulse (SGEMP) in terminal protection devices (TPD's) to non-interface or buried circuits of spacecraft electronics boxes. The analysis approach is outlined and results obtained from a computer based solution of the analysis are presented along with test data collected to empirically verify the analysis. Finally an example is provided in which the analysis results are used to calculate the energy coupled to a buried circuit so that a comparison of known device pulse burn out levels can be made. This technique provides an assessment of device susceptibility to the induced fields for representative circuit board trace layouts.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
埋地电路感应磁场耦合
分析了终端保护装置(TPD)中系统产生电磁脉冲(SGEMP)对航天器电子箱非接口电路或埋地电路的磁场耦合问题。本文概述了分析方法,并给出了基于计算机的分析解决方案的结果,以及为经验验证分析而收集的测试数据。最后给出了一个实例,将分析结果用于计算与埋地电路耦合的能量,以便对已知器件的脉冲烧毁电平进行比较。该技术为代表性电路板走线布局提供了器件对感应场敏感性的评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A Comparison of Three Techniques for Evaluating the Vector Potential of a Vertical Current Element Radiating Over the Lossy Half-Space Minimization of Radiation from a System of Interconnected Computer Equipment Inside an Anechoic Chamber Predicting Intermodulation Levels Due to Distortion in Linear Broadband Power Amplifiers A Practical Culling Strategy to Assist Frequency Assignment for Land Mobile Radio Systems A New Integro-Differential Equation for the Time-Domain Analysis of Thin-Wire Structures
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1