Polarization extinction ratio measurement for multi-functional integrated optic chip against birefringence dispersion and noise

Abstract

We present a method for measuring polarization extinction ratio (PER) of multi-functional integrated optic chip (MFIOC) based on White light interferometry (WLI) against birefringence dispersion (BD) and noise. Instead of reading peak value, this method obtains PER via calculating the energy of the interferogram, which is theoretically proved that is independent of BD and proportional to the square of its peak value. In addition, the results of simulation demonstrate the method has an advantage of noise robustness versus the conventional peak value method. Eventually, experiment results of 100 measurements for a MFIOC are agree with the theory and simulation results.