M. Bar, J. Perrenoud, R. Wilks, S. Buecheler, L. Kranz, C. Fella, J. Skarp, M. Blum, W. Yang, L. Weinhardt, C. Heske, A. Tiwari
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引用次数: 0
Abstract
We have used soft x-ray emission spectroscopy to study the impact of the CdCl2 activation treatment on the chemical structure of the CdTe/ZnO1−xSx interface. We find a pronounced chemical interaction, most prominently the interfacial intermixing of Cd and Zn. Furthermore, the formation of S-Cd bonds at the expense of S-Zn bonds can be observed.