{"title":"Use of Thermal Waves for Microscopic NDT Purposes","authors":"J. Jaarinen, R. Rajala, T. Tiusanen, M. Luukkala","doi":"10.1109/T-SU.1985.31605","DOIUrl":null,"url":null,"abstract":"Abstmct-The thermal waves that are generated in connection with the photoacoustic and photothermal effect can be used to probe microscopic features of various solid-state samples. Even relatively low frequency thermal waves can be useful for nondestructive testing.","PeriodicalId":371797,"journal":{"name":"IEEE Transactions on Sonics and Ultrasonics","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Sonics and Ultrasonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/T-SU.1985.31605","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Abstmct-The thermal waves that are generated in connection with the photoacoustic and photothermal effect can be used to probe microscopic features of various solid-state samples. Even relatively low frequency thermal waves can be useful for nondestructive testing.
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