Secure Leakage-Proof Public Verification of IP Marks in VLSI Physical Design

Debasri Saha, S. Sur-Kolay
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引用次数: 2

Abstract

Reuse of Intellectual Property (IP) of VLSI physical design facilitates integration of more components on a single chip in shrinking time-to-market. For intellectual property protection (IPP), various kinds of IP marks are embedded into the design for establishing the veracity of a legal owner. However, public verification of IP marks is not leakage-proof. Current techniques include a sufficiently large set of public marks containing a header and a message body in addition to private ones to facilitate only public verification at the cost of significant increase in design overhead. But these techniques are not effective, as attackers manage to obtain potential clues to tamper public marks rendering public verification invalid and may also suitably override the marks to include own signature resulting in wrong public identification of IP owner. Here we propose a zero-knowledge protocol to ensure robust and absolutely leakage proof convincing public verification with the help of private marks. We have tested our protocol for FPGA benchmarks. The results on overhead and robustness are encouraging.
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VLSI物理设计中IP标记的安全防漏公开验证
VLSI物理设计的知识产权(IP)重用有助于在单个芯片上集成更多组件,缩短上市时间。对于知识产权保护(IPP),在设计中嵌入各种知识产权标志,以确定合法所有者的真实性。然而,对知识产权商标的公开验证并不是防漏的。目前的技术包括一组足够大的公共标记,除了私有标记外,还包含标头和消息体,以便仅以显著增加设计开销为代价进行公共验证。但是这些技术并不有效,因为攻击者设法获得篡改公共标记的潜在线索,从而使公共验证无效,并且还可能适当地覆盖标记以包含自己的签名,从而导致错误的IP所有者的公共识别。在此,我们提出了一个零知识协议,以确保在私有标记的帮助下进行可靠的绝对防泄漏的公开验证。我们已经对我们的协议进行了FPGA基准测试。开销和健壮性方面的结果令人鼓舞。
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