Measuring the complex Joint Spectral Amplitude of photon pairs with a compact silicon chip

M. Borghi
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Abstract

Stimulated Emission Tomography (SET) is a technique which maps the Joint Spectral Amplitude (JSA) of photon pairs with extremely high signal to noise ratio and low integration times. While the modulus of the JSA is easy to access, the retrieval of the Joint Spectral Phase (JSP) is far more challenging and requires advanced interferometric techniques. Here we present and validate a scheme to measure the complex JSA by using a reconfigurable silicon chip. In particular, we map the rich structure of the JSP of a silicon microresonator.
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受激发射层析成像(SET)是一种具有极高信噪比和低积分时间的光子对联合谱幅(JSA)的成像技术。虽然JSA的模量很容易获得,但联合光谱相位(JSP)的检索更具挑战性,需要先进的干涉测量技术。本文提出并验证了一种利用可重构硅芯片测量复杂JSA的方案。特别地,我们绘制了硅微谐振器JSP的丰富结构。
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