{"title":"Multihop FD Relaying with Fixed and Random Phase Errors","authors":"P. Sharma, Kamal Agrawal, P. Garg","doi":"10.1109/NCC.2018.8600038","DOIUrl":null,"url":null,"abstract":"This paper investigates the error rate performance of a multihop decode and forward (DF) relaying systems, in which all the relays are considered to operate in full-duplex mode. The effect of residual self-loop interference (RSLI) is characterized as a fading effect and modeled with the generalized Nakagami-m distribution. We also consider the effect of the random and fixed phase errors on the performance of gray coded M -ary phase shift keying (MPSK). The random phase errors, which are assumed to be caused by imperfections in the phase locked loop (PLL), are characterized by von-Mises distribution. All the analytical results presented in this paper are supported by Monte Carlo simulations.","PeriodicalId":121544,"journal":{"name":"2018 Twenty Fourth National Conference on Communications (NCC)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Twenty Fourth National Conference on Communications (NCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NCC.2018.8600038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper investigates the error rate performance of a multihop decode and forward (DF) relaying systems, in which all the relays are considered to operate in full-duplex mode. The effect of residual self-loop interference (RSLI) is characterized as a fading effect and modeled with the generalized Nakagami-m distribution. We also consider the effect of the random and fixed phase errors on the performance of gray coded M -ary phase shift keying (MPSK). The random phase errors, which are assumed to be caused by imperfections in the phase locked loop (PLL), are characterized by von-Mises distribution. All the analytical results presented in this paper are supported by Monte Carlo simulations.