{"title":"ANISOTROPY AND STRUCTURAL CHARACTERIZATION OF Co/Pd MULTILAYER THIN FILMS","authors":"P. Vahdani, A. S. Rozatian, J. Amighian","doi":"10.1142/S1793617908000215","DOIUrl":null,"url":null,"abstract":"In this paper, magnetic and structural properties as well as the interface morphology of a series of sputtered Co/Pd multilayer thin films have been investigated. Interface morphology has been studied from grazing incidence specular and off-specular X-ray measurements using synchrotron radiation. High-angle X-ray diffraction measurements indicate a modulated structure which is strongly textured grown along (111) direction. The relation between intensity and the number of bilayers for different peaks of high-angle X-ray diffraction measurements has been investigated and compared to the grazing incidence X-ray scattering results. Vibrating sample magnetometer measurements have shown perpendicular magnetic anisotropy for all samples with Keff reaching highest value for those samples with highest fractal parameter.","PeriodicalId":166807,"journal":{"name":"Advances in Synchrotron Radiation","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advances in Synchrotron Radiation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/S1793617908000215","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
In this paper, magnetic and structural properties as well as the interface morphology of a series of sputtered Co/Pd multilayer thin films have been investigated. Interface morphology has been studied from grazing incidence specular and off-specular X-ray measurements using synchrotron radiation. High-angle X-ray diffraction measurements indicate a modulated structure which is strongly textured grown along (111) direction. The relation between intensity and the number of bilayers for different peaks of high-angle X-ray diffraction measurements has been investigated and compared to the grazing incidence X-ray scattering results. Vibrating sample magnetometer measurements have shown perpendicular magnetic anisotropy for all samples with Keff reaching highest value for those samples with highest fractal parameter.
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