{"title":"Simplified model for on-chip interconnects in electromagnetic modelling of System-in-Package","authors":"S. M. Holik, T. Drysdale","doi":"10.1109/ICEAA.2010.5653910","DOIUrl":null,"url":null,"abstract":"We present effective medium approximation (EMA) that provides an homogeneous equivalent for the top layer of on-chip interconnects in an integrated circuit. An empirical mixing model for straightforward and fast extraction of the effective dielectric constant of a slab of integrated circuit wiring and its analytical formulation based on Maxwell-Garnett rule is presented for a range of aspect ratios, dielectric materials, metal fills, and frequencies. We expect this approach to find use in the electromagnetic modeling of System-in-Package. Experimental validation of proposed approach is demonstrated by free space measurement of a grating structure illuminated by a pair of lens horn antennas.","PeriodicalId":375707,"journal":{"name":"2010 International Conference on Electromagnetics in Advanced Applications","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on Electromagnetics in Advanced Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEAA.2010.5653910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We present effective medium approximation (EMA) that provides an homogeneous equivalent for the top layer of on-chip interconnects in an integrated circuit. An empirical mixing model for straightforward and fast extraction of the effective dielectric constant of a slab of integrated circuit wiring and its analytical formulation based on Maxwell-Garnett rule is presented for a range of aspect ratios, dielectric materials, metal fills, and frequencies. We expect this approach to find use in the electromagnetic modeling of System-in-Package. Experimental validation of proposed approach is demonstrated by free space measurement of a grating structure illuminated by a pair of lens horn antennas.