High-power and high-efficiency GaN HEMT amplifiers

K. Joshin, T. Kikkawa
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引用次数: 11

Abstract

We report a current status of high-power GaN HEMTs for high-power and high-efficiency amplifiers with higher efficiency by 5% especially at a backed-off region than the conventional GaN HEMTs. First, we introduce our specific device structure GaN HEMT with dispersion-free I-V characteristics, low Idsq-drift and high reliability. Record average drain efficiency of over 50% and linear gain of 17.2 dB were obtained at an output power of 45 dBm and 2.5 GHz. Next, we discuss their reliability with high-temperature life tests resulting in their estimated life of over 1 times 106 hours at Tj of 200degC. Finally, we describe the next generation GaN HEMTs for millimeter-wave applications.
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大功率、高效率GaN HEMT放大器
我们报道了用于大功率和高效率放大器的大功率GaN hemt的现状,其效率比传统的GaN hemt高出5%,特别是在背向区域。首先,我们介绍了我们的特定器件结构GaN HEMT,具有无色散I-V特性,低idq漂移和高可靠性。在输出功率为45 dBm,频率为2.5 GHz时,平均漏极效率超过50%,线性增益达到17.2 dB。接下来,我们通过高温寿命测试讨论了它们的可靠性,结果表明它们在温度为200摄氏度时的估计寿命超过1倍106小时。最后,我们描述了用于毫米波应用的下一代GaN hemt。
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