Distance Characteristics of Field Peak Value of Transient Electric Field Caused by Sphere-Gap ESD Using a Optical E-Field Probe

K. Kawamata, S. Ishigami, O. Fujiwara
{"title":"Distance Characteristics of Field Peak Value of Transient Electric Field Caused by Sphere-Gap ESD Using a Optical E-Field Probe","authors":"K. Kawamata, S. Ishigami, O. Fujiwara","doi":"10.1109/EMCEurope51680.2022.9901110","DOIUrl":null,"url":null,"abstract":"Impulsive wideband electromagnetic noise is occurred by ESD (Electrostatic Discharge). The transient EM noise is an awkward problem that causes equipment malfunctions and failures. Therefore, in order to confirm the validity of the radiation model for discussing the mechanism of EM noise radiation by ESD, and the distance characteristic of the electric field peak value caused by ESD in a pair of spherical electrodes was examined using a wideband optical field probe. As a result, the field peak value was attenuated according to 1/d3 of the distance d in the very vicinity of the discharge gap, and was attenuated according to 1/d2 and 1/$d$ at the far distance. From this result, it was confirmed that the EM field radiation caused by ESD of the pair of spherical electrodes can be explained by using the short dipole model.","PeriodicalId":268262,"journal":{"name":"2022 International Symposium on Electromagnetic Compatibility – EMC Europe","volume":"52 362 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Symposium on Electromagnetic Compatibility – EMC Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEurope51680.2022.9901110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Impulsive wideband electromagnetic noise is occurred by ESD (Electrostatic Discharge). The transient EM noise is an awkward problem that causes equipment malfunctions and failures. Therefore, in order to confirm the validity of the radiation model for discussing the mechanism of EM noise radiation by ESD, and the distance characteristic of the electric field peak value caused by ESD in a pair of spherical electrodes was examined using a wideband optical field probe. As a result, the field peak value was attenuated according to 1/d3 of the distance d in the very vicinity of the discharge gap, and was attenuated according to 1/d2 and 1/$d$ at the far distance. From this result, it was confirmed that the EM field radiation caused by ESD of the pair of spherical electrodes can be explained by using the short dipole model.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
球隙静电放电引起的瞬态电场峰值距离特性研究
脉冲宽带电磁噪声是由静电放电产生的。瞬态电磁噪声是导致设备故障和失效的一个棘手问题。因此,为了验证该辐射模型对探讨静电放电引起电磁噪声辐射机理的有效性,采用宽带光场探头对一对球形电极中静电放电引起的电场峰值的距离特性进行了检测。结果表明,电场峰值在放电间隙附近按距离d的1/d3衰减,在较远的距离处按距离d的1/d2和1/d衰减。由此证实,用短偶极子模型可以解释球面电极对静电放电引起的电磁场辐射。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Combining 2oo3 Voting and Hamming Error Correction to Reduce the Occurrence of False Negatives in Wired Communication Lines under Continuous-Wave Electromagnetic Disturbances Time-domain Multitone Impedance Measurement System for Space Applications Lumped Circuit Model for Concentrically Arranged Conductors in Power Electronic Systems On Excitation Periodicity in Continuously Stirred Reverberation Chambers Inverter Interference on Charging Communication System during 400 V DC Charging of Vehicle
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1