Identity Testing for Radical Expressions

N. Balaji, Klara Nosan, M. Shirmohammadi, J. Worrell
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引用次数: 1

Abstract

We study the Radical Identity Testing problem (RIT): Given an algebraic circuit representing a polynomial and nonnegative integers a1, …, ak and d1, …, dk, written in binary, test whether the polynomial vanishes at the real radicals , i.e., test whether . We place the problem in coNP assuming the Generalised Riemann Hypothesis (GRH), improving on the straightforward PSPACE upper bound obtained by reduction to the existential theory of reals. Next we consider a restricted version, called 2-RIT, where the radicals are square roots of prime numbers, written in binary. It was known since the work of Chen and Kao [16] that 2-RIT is at least as hard as the polynomial identity testing problem, however no better upper bound than PSPACE was known prior to our work. We show that 2-RIT is in coRP assuming GRH and in coNP unconditionally. Our proof relies on theorems from algebraic and analytic number theory, such as the Chebotarev density theorem and quadratic reciprocity.
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根式表达式的同一性测试
本文研究了根恒等式检验问题(RIT):给定一个代数电路,表示一个多项式和非负整数a1,…,ak和d1,…,dk,以二进制表示,检验该多项式是否在实数根处消失,即检验是否。我们采用广义黎曼假设(GRH)将问题置于coNP中,改进了通过还原到实数存在论得到的直接PSPACE上界。接下来我们考虑一个限制版本,称为2-RIT,其中的根号是质数的平方根,用二进制表示。自Chen和Kao[16]的工作以来,人们就知道2-RIT至少与多项式恒等检验问题一样难,但在我们的工作之前,没有比PSPACE更好的上界。我们证明了2-RIT在假定GRH条件下存在于coRP,无条件地存在于coNP条件下。我们的证明依赖于代数和解析数论中的定理,如切波塔列夫密度定理和二次互易性。
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