Architecture Exploration for HLS-Oriented FPGA Debug Overlays

Al-Shahna Jamal, Jeffrey B. Goeders, S. Wilton
{"title":"Architecture Exploration for HLS-Oriented FPGA Debug Overlays","authors":"Al-Shahna Jamal, Jeffrey B. Goeders, S. Wilton","doi":"10.1145/3174243.3174254","DOIUrl":null,"url":null,"abstract":"High-Level Synthesis (HLS) promises improved designer productivity, but requires a debug ecosystem that allows designers to debug in the context of the original source code. Recent work has presented in-system debug frameworks where instrumentation added to the design collects trace data as the circuit runs, and a software tool that allows the user to replay the execution using the captured data. When searching for the root cause of a bug, the designer may need to modify the instrumentation to collect data from a new part of the design, requiring a lengthy recompile. In this paper, we propose a flexible debug overlay family that provides software-like debug turn-around times for HLS generated circuits. At compile time, the overlay is added to the design and compiled. At debug time, the overlay can be configured many times to implement specific debug scenarios without a recompilation. This paper first outlines a number of \"capabilities\" that such an overlay should have, and then describes architectural support for each of these capabilities. The cheapest overlay variant allows selective variable tracing with only a 1.7% increase in area overhead from the baseline debug instrumentation, while the deluxe variant offers 2x-7x improvement in trace buffer memory utilization with conditional buffer freeze support.","PeriodicalId":164936,"journal":{"name":"Proceedings of the 2018 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2018 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3174243.3174254","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

High-Level Synthesis (HLS) promises improved designer productivity, but requires a debug ecosystem that allows designers to debug in the context of the original source code. Recent work has presented in-system debug frameworks where instrumentation added to the design collects trace data as the circuit runs, and a software tool that allows the user to replay the execution using the captured data. When searching for the root cause of a bug, the designer may need to modify the instrumentation to collect data from a new part of the design, requiring a lengthy recompile. In this paper, we propose a flexible debug overlay family that provides software-like debug turn-around times for HLS generated circuits. At compile time, the overlay is added to the design and compiled. At debug time, the overlay can be configured many times to implement specific debug scenarios without a recompilation. This paper first outlines a number of "capabilities" that such an overlay should have, and then describes architectural support for each of these capabilities. The cheapest overlay variant allows selective variable tracing with only a 1.7% increase in area overhead from the baseline debug instrumentation, while the deluxe variant offers 2x-7x improvement in trace buffer memory utilization with conditional buffer freeze support.
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面向hls的FPGA调试覆盖的体系结构探索
高级综合(High-Level Synthesis, HLS)承诺提高设计人员的工作效率,但需要一个调试生态系统,允许设计人员在原始源代码的上下文中进行调试。最近的工作提出了系统内调试框架,其中添加到设计中的仪表在电路运行时收集跟踪数据,以及允许用户使用捕获的数据重播执行的软件工具。在搜索bug的根本原因时,设计人员可能需要修改工具以从设计的新部分收集数据,这需要长时间的重新编译。在本文中,我们提出了一个灵活的调试覆盖系列,为HLS生成的电路提供类似软件的调试周期。在编译时,将覆盖层添加到设计中并进行编译。在调试时,可以多次配置覆盖以实现特定的调试场景,而无需重新编译。本文首先概述了这种覆盖应该具有的一些“功能”,然后描述了对这些功能的体系结构支持。最便宜的覆盖变体允许选择性变量跟踪,仅比基线调试仪器增加1.7%的面积开销,而豪华变体在跟踪缓冲区内存利用率方面提供了2 -7倍的改进,并支持条件缓冲区冻结。
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