{"title":"A study of impulsive noise immunity for wavelet-OFDM-based power line communications","authors":"Hao-Chun Yu, Ying-Ren Chien, H. Tsao","doi":"10.1109/ICCPS.2016.7751103","DOIUrl":null,"url":null,"abstract":"In the specification of IEEE P1901-2010, which is the standard for high speed communication devices via electric power lines, two physical layer technologies are defined. One is called fast Fourier transform (FFT)-based orthogonal frequency-division multiplexing (OFDM) and the other is wavelet-based OFDM (Wavelet-OFDM). However, few studies have been discussed the impact of impulsive noise (IN) for Wavelet-OFDM-based PLC systems. This paper preliminarily study the impact of IN on both FFT-OFDM and Wavelet-OFDM-based PLC systems in additive white Gaussian noise (AWGN) channel model. Due to the overlapping in time domain, the Wavelet-OFDM become more prone to IN than the FFT-OFDM.","PeriodicalId":348961,"journal":{"name":"2016 International Conference On Communication Problem-Solving (ICCP)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference On Communication Problem-Solving (ICCP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCPS.2016.7751103","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
In the specification of IEEE P1901-2010, which is the standard for high speed communication devices via electric power lines, two physical layer technologies are defined. One is called fast Fourier transform (FFT)-based orthogonal frequency-division multiplexing (OFDM) and the other is wavelet-based OFDM (Wavelet-OFDM). However, few studies have been discussed the impact of impulsive noise (IN) for Wavelet-OFDM-based PLC systems. This paper preliminarily study the impact of IN on both FFT-OFDM and Wavelet-OFDM-based PLC systems in additive white Gaussian noise (AWGN) channel model. Due to the overlapping in time domain, the Wavelet-OFDM become more prone to IN than the FFT-OFDM.
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