Experiments and Modeling of Dynamic Floating Body Effects in 1T-Dram Fully Depleted SOI Devices

M. Bawedin, S. Cristoloveanu, V. Dessard, Denis Flandre
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引用次数: 1

Abstract

We describe the transient floating-body mechanism which occurs in fully depleted SOI transistors and leads to a memory effect. A physics-based model for the potential variation with time is proposed and validated by numerical simulations. This model reproduces and clarifies the operation of the novel capacitor-less MSDRAM, the properties of which are discussed.
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1T-Dram全耗尽SOI器件中动态浮体效应的实验与建模
我们描述了在完全耗尽的SOI晶体管中发生并导致记忆效应的瞬态浮体机制。提出了电势随时间变化的物理模型,并通过数值模拟进行了验证。该模型再现并阐明了新型无电容MSDRAM的工作原理,并对其特性进行了讨论。
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