{"title":"Specification and Testing of Consumer Linear Integrated Circuits","authors":"H. Ebenhoech","doi":"10.1109/TBTR1.1973.299710","DOIUrl":null,"url":null,"abstract":"Integrated Circuits (ICs) in consumer equipment are a fact. In 1973 in excess of 40 million pieces will be used in TV sets and more than 25 million pieces will go into audio applications, to name only two consumer markets. The total number of consumer ICs available will exceed 180 million pieces. If they do not all work properly, there will be a certain number of disatisfied TV viewers, radio listeners, tape recorder owners, and other users of IC equipment. ICs are tested to prevent this occurrence. Testing schemes employed vary considerably and are covered in the following discussion. Test philosophies will be pointed out and a recommendation for specifications will be made.","PeriodicalId":426905,"journal":{"name":"IEEE Transactions on Broadcast and Television Receivers","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1973-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Broadcast and Television Receivers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TBTR1.1973.299710","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Integrated Circuits (ICs) in consumer equipment are a fact. In 1973 in excess of 40 million pieces will be used in TV sets and more than 25 million pieces will go into audio applications, to name only two consumer markets. The total number of consumer ICs available will exceed 180 million pieces. If they do not all work properly, there will be a certain number of disatisfied TV viewers, radio listeners, tape recorder owners, and other users of IC equipment. ICs are tested to prevent this occurrence. Testing schemes employed vary considerably and are covered in the following discussion. Test philosophies will be pointed out and a recommendation for specifications will be made.
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