High Reflectance Measurements Using the Cavity Phase Shift Method

M. Kwok, J. Herbelin, R.A. Ueunten, G. I. Segal
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Abstract

The cavity phase shift (CAPS) method shows promise for direct measurements of high reflectances on various spherical surfaces at reasonable spatial resolution (1mm). The unknown reflectance is placed in an high Q optical interferometer, through which an intensity modulated laser beam is passed. A phase shift in the sine wave modulation yields the direct measurement. The multi-pass nature of an interferometer causes increased sensitivity and precision as the reflectances improve. Previous work with this approach has been done in the visible region. 1,2 This work has included the abilities to detect high transmittances or low absorbance-scattering in optical mirrors.
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用腔相移法测量高反射率
空腔相移(CAPS)方法有望在合理的空间分辨率(1mm)下直接测量各种球面上的高反射率。将未知反射率放置在高Q光干涉仪中,强度调制激光束通过该干涉仪。正弦波调制中的相移产生直接测量。随着反射率的提高,干涉仪的多通特性增加了灵敏度和精度。以前使用这种方法的工作是在可见区域完成的。这项工作包括在光学反射镜中检测高透射率或低吸收散射的能力。
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