Interdependency of test environment and current breaking capacity of a model vacuum switch

A. Feilbach, H. Menne, V. Hinrichsen, U. Hauf, M. Heilmaier, M. Böning, F. Müller
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Abstract

In contact material development it is elementary to have a fundamental understanding of the effects of the test environment on the switching performance. However, the complexity of those dependencies make it difficult to identify a definite cause-effect relationship between contact material and switching properties, especially if the effect of small variations in the contact material, such as the particle distribution and the morphology, shall be investigated. This paper sensitizes to the strong interdependencies of test conditions and current breaking capacity. To identify these dependencies the test environment was systematically modified. The modifications could reproducibly be correlated with their effect on the test results. In particular, the topology of the high current circuit and the contact bolt design showed strong effects. The circuit topology was optimized for reduction of the magnetic flux density within the contact gap, and it was standardized to ensure long-term reproducibility of future results. The modifications of the test circuit could also be recognized in the characteristic arcing voltage.
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试验环境与真空开关断流能力的相互关系
在接触材料的开发中,对测试环境对开关性能的影响有一个基本的了解是很基本的。然而,这些依赖关系的复杂性使得很难确定触点材料和开关性能之间的明确因果关系,特别是如果要研究触点材料的微小变化(如颗粒分布和形态)的影响。本文对测试条件和电流分断能力的强相互依赖性很敏感。为了识别这些依赖关系,测试环境被系统地修改了。这些修改可以重复地与它们对测试结果的影响相关。特别是大电流电路的拓扑结构和接触螺栓的设计表现出强烈的影响。电路拓扑结构进行了优化,以降低接触间隙内的磁通密度,并进行了标准化,以确保未来结果的长期可重复性。测试电路的修改也可以从特征电弧电压中识别出来。
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