{"title":"Physical and Mathematical Modelling of Electrophysical Processes for Solution of Electromagnetic Compatibility Problems","authors":"M. Rezinkina, O. Rezinkin, S. Buryakovskiy","doi":"10.1109/IEPS51250.2020.9263133","DOIUrl":null,"url":null,"abstract":"Mathematical modeling of the processes at the electromagnetic fields (EMF) of natural and artificial origin application to sensitive electronic equipment has been carried out. Test installations for full-scale physical modeling of the EMF impulses impacts on sensitive electronic equipment, aviation technique, etc. or their critical parts have been elaborated.","PeriodicalId":235261,"journal":{"name":"2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEPS51250.2020.9263133","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Mathematical modeling of the processes at the electromagnetic fields (EMF) of natural and artificial origin application to sensitive electronic equipment has been carried out. Test installations for full-scale physical modeling of the EMF impulses impacts on sensitive electronic equipment, aviation technique, etc. or their critical parts have been elaborated.
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