{"title":"A New Approach to Testing High-Voltage Deflection Tubes","authors":"H. Wittlinger, J. Dean","doi":"10.1109/TBTR2.1962.4503191","DOIUrl":null,"url":null,"abstract":"Techniques which are generally applicable to high-voltage deflection tubes are discussed in this paper, with specific application to television horizontal-deflection amplifiers. In an entirely new approach to testing horizontal-deflection amplifiers, the tubes are tested in circuits that closely simulate actual operating conditions. Six separate tests have been replaced by a single test. Carefully controlled test conditions and the development of several unique detectors for these tests have resulted in repeatable and reproducible results. Although the circuits have become more complex as a result of simplifying the testing procedures, cost of over-all testing has been reduced and product quality has been improved.","PeriodicalId":136909,"journal":{"name":"Ire Transactions on Broadcast and Television Receivers","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1962-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ire Transactions on Broadcast and Television Receivers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TBTR2.1962.4503191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Techniques which are generally applicable to high-voltage deflection tubes are discussed in this paper, with specific application to television horizontal-deflection amplifiers. In an entirely new approach to testing horizontal-deflection amplifiers, the tubes are tested in circuits that closely simulate actual operating conditions. Six separate tests have been replaced by a single test. Carefully controlled test conditions and the development of several unique detectors for these tests have resulted in repeatable and reproducible results. Although the circuits have become more complex as a result of simplifying the testing procedures, cost of over-all testing has been reduced and product quality has been improved.