System for Dynamic Testing of Optical Storage Media Pit Formation

Abstract

When working with optical storage material, the large field of data poses two problems: 1) writing the hole or pit with a singular set of controlled parameters; and 2) correlating this pit to the analysis system. The pit formation and analysis need to be simultaneous or nearly real-time. The intent of this apparatus was to bring together a large variety of adjustable parameters and the ability to analyze them such that, as the pits are formed, we can evaluate the results and immediately compensate the pit formation system in order to optimize or evaluate a given media. The system was assembled using a large multi-port testbed.